In the work package WP6-JRA2, the main goal will be the exploration of valid qualification procedures to be effective at system level. For this purpose, we define with the term system as a structure composed of basic electronic elements such as transistors, diodes, capacitors and complex elements such as ADC/DAC converters, frequency synthesizers, voltage regulators, memories, processors, FPGAs and SoCs. The difficulty of this task is due to the complexity of the systems and the heterogeneity of the composing parts. Its main added value is a reduced qualification cost and time, without significantly affecting the radiation hardness assurance level.

The work package will be mostly acted and led by the University of Montpellier, with the key contribution of the universities UC3M and KUL, as well as CERN. Interactions with partners hosting irradiation facilities and with experience in radiation-hardened system will be promoted, in order to better identify the specific requirements typical of each different irradiation test. The work package has three scientific tasks. The first one aims at identifying general practices for system testing; the other two tasks are related to pass/fail testing and test with high observation capabilities, respectively.

Results derived from this WP will be integrated in recommendations and guidelines related to the complementarity and representativeness of different experimental conditions with respect to those encountered in applications.

Remote experiment in ChipIR (Courtesy of LIRMM, University of Montpellier)